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dc.contributor.authorZhang, Jie
Du, Rui-Rui
Pfeiffer, L.N.
West, K.W.
dc.date.accessioned 2018-02-26T17:22:12Z
dc.date.available 2018-02-26T17:22:12Z
dc.date.issued 2018
dc.identifier.citation Zhang, Jie, Du, Rui-Rui, Pfeiffer, L.N., et al.. "Simultaneous measurements of microwave photoresistance and cyclotron reflection in the multiphoton regime." Physical Review B, 97, no. 3 (2018) American Physical Society: https://doi.org/10.1103/PhysRevB.97.035437.
dc.identifier.urihttps://hdl.handle.net/1911/99294
dc.description.abstract We simultaneously measure photoresistance with electrical transport and coupled plasmon-cyclotron resonance using microwave reflection spectroscopy in high-mobility GaAs/AlGaAs quantum wells under a perpendicular magnetic field. Multiphoton transitions are revealed as sharp peaks in the resistance and the cyclotron reflection on samples with various carrier densities. Our main finding is that plasmon coupling is relevant in the cyclotron reflection spectrum but has not been observed in the electrical conductivity signal. We discuss possible mechanisms relevant to reflection or dc conductivity signal to explain this discrepancy. We further confirm a trend that more multiphoton features can be observed using higher carrier density samples.
dc.language.iso eng
dc.publisher American Physical Society
dc.rights Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
dc.title Simultaneous measurements of microwave photoresistance and cyclotron reflection in the multiphoton regime
dc.type Journal article
dc.citation.journalTitle Physical Review B
dc.citation.volumeNumber 97
dc.citation.issueNumber 3
dc.identifier.digital Simultaneous-measurements
dc.type.dcmi Text
dc.identifier.doihttps://doi.org/10.1103/PhysRevB.97.035437
dc.type.publication publisher version
dc.citation.articleNumber 035437


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