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dc.contributor.authorOrloff, Nathan D.
Long, Christian J.
Obrzut, Jan
Maillaud, Laurent
Mirri, Francesca
Kole, Thomas P.
McMichael, Robert D.
Pasquali, Matteo
Stranick, Stephan J.
Liddle, J. Alexander
dc.date.accessioned 2017-05-12T17:10:13Z
dc.date.available 2017-05-12T17:10:13Z
dc.date.issued 2015
dc.identifier.citation Orloff, Nathan D., Long, Christian J., Obrzut, Jan, et al.. "Noncontact conductivity and dielectric measurement for high throughput roll-to-roll nanomanufacturing." Scientific Reports, 5, (2015) Springer Nature: http://dx.doi.org/10.1038/srep17019.
dc.identifier.urihttps://hdl.handle.net/1911/94245
dc.description.abstract Advances in roll-to-roll processing of graphene and carbon nanotubes have at last led to the continuous production of high-quality coatings and filaments, ushering in a wave of applications for flexible and wearable electronics, woven fabrics, and wires. These applications often require specific electrical properties, and hence precise control over material micro- and nanostructure. While such control can be achieved, in principle, by closed-loop processing methods, there are relatively few noncontact and nondestructive options for quantifying the electrical properties of materials on a moving web at the speed required in modern nanomanufacturing. Here, we demonstrate a noncontact microwave method for measuring the dielectric constant and conductivity (or geometry for samples of known dielectric properties) of materials in a millisecond. Such measurement times are compatible with current and future industrial needs, enabling real-time materials characterization and in-line control of processing variables without disrupting production.
dc.language.iso eng
dc.publisher Springer Nature
dc.rights This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the ma
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.title Noncontact conductivity and dielectric measurement for high throughput roll-to-roll nanomanufacturing
dc.type Journal article
dc.citation.journalTitle Scientific Reports
dc.contributor.org Smalley Institute for Nanoscale Science and Technology
dc.citation.volumeNumber 5
dc.type.dcmi Text
dc.identifier.doihttp://dx.doi.org/10.1038/srep17019
dc.identifier.pmcid PMC4655476
dc.identifier.pmid 26592441
dc.type.publication publisher version
dc.citation.articleNumber 17019


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This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the ma
Except where otherwise noted, this item's license is described as This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the ma