A number of different methods for electrically characterizing ZnSe thin films are presented. These include the Hall effect, current-voltage profiling, and capacitance-voltage profiling. The planar Schottky technique is ...

Using the focused ion beam sputtering capabilities of Scanning Ion Microscope with Polarization Analysis (SIMPA), arrays of regular shaped particles with sizes in the order of 10$\mu$m are produced from a 35nm thick $\rm ...