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Influence of Effective Modulus on Period-Doubling Bifurcation in Atomic Force Microscopy: Investigation and Implementation for Sample Characterization
Atomic force microscope (AFM) is an important tool for measuring the topographical and other properties of a sample with nanometer resolution. The cantilever probe of the AFM is influenced by nonlinear interaction forces ...
Nonlinear Dynamics in Atomic Force Microscopy for Various Excitation Conditions
The atomic force microscopy (AFM) is a high-resolution measurement tool for measuring sample topography and material properties in micro-scale and nano-scale research. The dynamics of the cantilever probe in AFM is influenced ...