Now showing items 1-5 of 5
Methods of electrically characterizing zinc selenide epitaxial layers on gallium arsenide substrates
A number of different methods for electrically characterizing ZnSe thin films are presented. These include the Hall effect, current-voltage profiling, and capacitance-voltage profiling. The planar Schottky technique is ...
Ferromagnetism of novel ultrathin films and multilayers: A study of Ru/C(0001) and Fe/Mn/Fe/Pd(100) using magneto-optic Kerr effect and spin-sensitive electron spectroscopies
The possibility of the existence of ferromagnetic order in Ru monolayers on the C(0001) graphite surface is studied using electron induced spin-polarized secondary electron emission (SPSEE). Below a surface Curie temperature ...
Implementation of SEMPA using a high efficiency retarding-potential Mott polarimeter
Scanning Electron Microscopy with Polarization Analysis (SEMPA) provides a novel tool with which to image surface magnetic structure. In SEMPA, a tightly focussed electron beam is directed at the sample surface and the ...
Magneto-optical Kerr effect studies of magnetic micro-structures produced using SIMPA
Using the focused ion beam sputtering capabilities of Scanning Ion Microscope with Polarization Analysis (SIMPA), arrays of regular shaped particles with sizes in the order of 10$\mu$m are produced from a 35nm thick $\rm ...
A thin film lithium niobate ferroelectric transistor
The incorporation of a thin film of LiNbO$\sb3$ in a conventional MOS (metal-oxide-semiconductor) structure gives the possibility of two fundamentally different types of computer memory architectures. One, based on ...