Scanning-Ion Microscopy with Polarization Analysis (Simpa)
We have developed a novel, high-resolution magnetic imaging technique, scanning-ion microscopy with polarization analysis (SIMP A). In SIMP A, a highly-focused, scanning Ga+ ion beam is used to excite spin-polarized electrons at surfaces of ferromagnetic materials. By measuring the intensity and the spin polarization of the emitted electrons using a newly developed, compact Mott polarimeter, topographic and magnetic images of magnetic structures are obtained. We report on first SIMP A studies on single crystalline Fe samples.