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dc.contributor.authorLi, J.
Rau, C.
dc.date.accessioned 2015-04-30T16:55:43Z
dc.date.available 2015-04-30T16:55:43Z
dc.date.issued 2004
dc.identifier.citation Li, J. and Rau, C.. "Magnetic domain structures of focused ion beam-patterned cobalt films using scanning ion microscopy with polarization analysis." Journal of Applied Physics, 95, (2004) AIP Publishing LLC: 6527. http://dx.doi.org/10.1063/1.1689433.
dc.identifier.urihttps://hdl.handle.net/1911/79700
dc.description.abstract Studies of magnetic domain distributions in patterned magnetic materials are of pivotal importance in the areas of ultrahigh density magnetic recording, MRAM design, and miniaturized magnetic sensor arrays. Scanning ion microscopy with polarizationanalysis (SIMPA) is used to perform in situ topographic and magnetic domain imaging and focused ion beam(FIB) patterning. For FIB-patterned 30 nm thick Co films, it is found that rectangular Co bars of sizes between 10–30 μm exhibit S type, whereas circular shaped magnetic elements show C type micromagnetic magnetization patterns. It is shown that SIMPA provides a simple way to directly identify different micromagnetic domain patterns.
dc.language.iso eng
dc.publisher AIP Publishing LLC
dc.rights This is an author's peer-reviewed final manuscript, as accepted by the publisher. The published article is copyrighted by AIP Publishing LLC.
dc.title Magnetic domain structures of focused ion beam-patterned cobalt films using scanning ion microscopy with polarization analysis
dc.type Journal article
dc.citation.journalTitle Journal of Applied Physics
dc.contributor.org Rice Quantum Institute
dc.contributor.org Center for Nanoscience and Technology
dc.citation.volumeNumber 95
dc.type.dcmi Text
dc.identifier.doihttp://dx.doi.org/10.1063/1.1689433
dc.type.publication post-print
dc.citation.firstpage 6527


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