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dc.contributor.authorKumar, Nardeep
Najmaei, Sina
Cui, Qiannan
Ceballos, Frank
Ajayan, Pulickel M.
Lou, Jun
Zhao, Hui
dc.date.accessioned 2013-04-24T15:32:37Z
dc.date.available 2013-04-24T15:32:37Z
dc.date.issued 2013
dc.identifier.citation Kumar, Nardeep, Najmaei, Sina, Cui, Qiannan, et al.. "Second harmonic microscopy of monolayer MoS2." Physical Review B, 87, (2013) American Physical Society: 161403(R). http://dx.doi.org/10.1103/PhysRevB.87.161403.
dc.identifier.urihttps://hdl.handle.net/1911/70968
dc.description.abstract We show that the lack of inversion symmetry in monolayer MoS2 allows strong optical second harmonic generation. The second harmonic of an 810-nm pulse is generated in a mechanically exfoliated monolayer, with a nonlinear susceptibility on the order of 10−7 m/V. The susceptibility reduces by a factor of seven in trilayers, and by about two orders ofmagnitude in even layers. A proof-of-principle second harmonicmicroscopymeasurement is performed on samples grown by chemical vapor deposition, which illustrates potential applications of this effect in the fast and noninvasive detection of crystalline orientation, thickness uniformity, layer stacking, and single-crystal domain size of atomically thin films of MoS2 and similar materials.
dc.language.iso eng
dc.publisher American Physical Society
dc.rights Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
dc.title Second harmonic microscopy of monolayer MoS2
dc.type Journal article
dc.contributor.funder Army Research Office, Multidisciplinary University Research Initiative
dc.contributor.funder Welch Foundation
dc.citation.journalTitle Physical Review B
dc.citation.volumeNumber 87
dc.embargo.terms none
dc.type.dcmi Text
dc.identifier.doihttp://dx.doi.org/10.1103/PhysRevB.87.161403
dc.identifier.grantID W911NF-11-1-0362 (Army Research Office, Multidisciplinary University Research Initiative)
dc.identifier.grantID C-1716 (Welch Foundation)
dc.type.publication publisher version
dc.citation.firstpage 161403(R)


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