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    • Indirect magnetic force microscopy 

      Sifford, Joshua; Walsh, Kevin J.; Tong, Sheng; Bao, Gang; Agarwal, Gunjan (2019)
      Magnetic force microscopy (MFM) is an atomic force microscopy (AFM)-based technique to map magnetic domains in a sample. MFM is widely used to characterize magnetic recording media, magnetic domain walls in materials, ...