Show simple item record

dc.contributor.authorLeuschen, Martin L.
Walker, Ian D.
Cavallaro, Joseph R.
dc.date.accessioned 2012-06-05T15:37:41Z
dc.date.available 2012-06-05T15:37:41Z
dc.date.issued 2001-04-01
dc.identifier.citation M. L. Leuschen, I. D. Walker and J. R. Cavallaro, "Evaluating the reliability of prototype degradable systems," Reliability Engineering and System Safety, vol. 72, no. 1, 2001.
dc.identifier.issn10.1016/S0951-8320(00)00097-1
dc.identifier.otherhttp://scholar.google.com/scholar?cluster=1372780904530680988&hl=en&as_sdt=0,44
dc.identifier.urihttps://hdl.handle.net/1911/64219
dc.description.abstract The technique introduced in this paper is a new technique for analyzing fault tolerant designs under considerable uncertainty, such as seen in unique or few-of-a-kind devices in poorly known environments or pre-prototype design analyses. This technique is able to provide useful information while maintaining the uncertainty inherent in the original specifications. The technique introduced here is a logical extension of the underlying concepts of fuzzy sets and Markov models. Although originally developed for robotic systems, the technique is more broadly applicable. This paper develops fuzzy Markov modeling and uses it to analyze a specific robot designed for hazardous waste removal and specific types of electronic systems.
dc.description.sponsorship National Science Foundation
dc.description.sponsorship Sandia National Laboratory
dc.language.iso eng
dc.publisher Elsevier Science Ltd
dc.subjectFault Trees
Markov modeling
Robotics
Interval arithmetic
Fuzzy sets
dc.title Evaluating the reliability of prototype degradable systems
dc.type Journal article
dc.citation.journalTitle Reliability Engineering and System Safety
dc.contributor.org Center for Multimedia Communication
dc.citation.volumeNumber 72
dc.citation.issueNumber 1
dc.type.dcmi Text
dc.type.dcmi Text
dc.identifier.doihttp://dx.doi.org/10.1016/S0951-8320(00)00097-1
dc.citation.firstpage 9
dc.citation.lastpage 20


Files in this item

Thumbnail

This item appears in the following Collection(s)

  • ECE Publications [1450]
    Publications by Rice University Electrical and Computer Engineering faculty and graduate students
  • Rice Wireless [268]
    Publications by Rice Faculty and graduate students in the Rice Wireless group

Show simple item record