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    • Enhanced VLSI Manufacturability Using an Integrated CAD Framework 

      Fossati, Humberto M.; Tittel, Frank K.; Wilson, William L.; Cavallaro, Joseph R. (1994-01-01)
      Continued improvements in VLSI performance, circuit density and production costs are possible, in part, do to significant advances in lithography. As feature sizes get smaller, design houses are faced with either improving ...