Show simple item record

dc.contributor.authorPapantoni-Kazakos, P.
dc.creatorPapantoni-Kazakos, P. 2007-10-31T00:57:54Z 2007-10-31T00:57:54Z 1976-11-20 2003-07-20
dc.description Tech Report
dc.description.abstract The Bhattacharyya, I-divergence, Vasershtein, variational and Levy distances are evaluated, compared and used for the reduction of n data to one feature. This reduction is obtained through a restricted linear transformation and the original data are assumed to be originating from two different jointly Gaussian classes. It is found that the Bhattacharyya, I-divergence and Vasershtein distances give the same "optimal" linear transformation that applied on the original n data result in one feature with maximum possible distance between classes. The distortion measures considered in the Vasershtein distance are |x-y| and (x-y)<sup>2</sup>. For the same distance measures and classes with equal covariances the Levy distance results in the same "optimal" linear transformation.
dc.description.sponsorship Air Force Office of Scientific Research
dc.language.iso eng
dc.title Some Distance Measures and Their Use in Feature Selection
dc.type Report
dc.citation.bibtexName techreport
dc.citation.journalTitle Rice University ECE Technical Report 2003-10-22
dc.citation.volumeNumber TR7611
dc.citation.issueNumber 7611
dc.type.dcmi Text
dc.type.dcmi Text
dc.identifier.citation P. Papantoni-Kazakos, "Some Distance Measures and Their Use in Feature Selection," Rice University ECE Technical Report, vol. TR7611, no. 7611, 1976.

Files in this item


This item appears in the following Collection(s)

  • ECE Publications [1278]
    Publications by Rice University Electrical and Computer Engineering faculty and graduate students

Show simple item record