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    Implementation of SEMPA using a high efficiency retarding-potential Mott polarimeter

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    Author
    Barnes, Julius, II
    Date
    1999
    Advisor
    Dunning, F. B.
    Degree
    Doctor of Philosophy
    Abstract
    Scanning Electron Microscopy with Polarization Analysis (SEMPA) provides a novel tool with which to image surface magnetic structure. In SEMPA, a tightly focussed electron beam is directed at the sample surface and the polarization of the ejected low-energy secondary electrons, which mirrors the local surface magnetization, is measured. A magnetic image is then built up by scanning the incident electron beam point-by-point over the sample surface. Here, a new SEMPA instrument is described that makes use of a high-efficiency retarding-potential Mott polarimeter. The incident electron beam is provided by an ISI-SX40 SEM column. Low-energy secondary electrons ejected from the sample surface are collected and transported to the Mott polarimeter by a series of electrostatic lenses. A Wein spin rotator is also included in the electron transport optics to allow measurement of the full vector polarization of the ejected electrons, and thus the surface vector magnetization. Tests show that the performance of the present SEMPA instrument is superior to that of earlier designs. The apparatus has been used to image the domain structure on the surface of an Fe 3% Si sample, and to image tracks recorded in-plane on a cobalt alloy medium.
    Keyword
    Physics; Electromagnetics; Condensed matter physics; Atomic physics
    Citation
    Barnes, Julius, II. "Implementation of SEMPA using a high efficiency retarding-potential Mott polarimeter." (1999) Diss., Rice University. https://hdl.handle.net/1911/19351.
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    Home | FAQ | Contact Us | Privacy Notice | Accessibility Statement
    Managed by the Digital Scholarship Services at Fondren Library, Rice University
    Physical Address: 6100 Main Street, Houston, Texas 77005
    Mailing Address: MS-44, P.O.BOX 1892, Houston, Texas 77251-1892
    Site Map