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dc.contributor.advisor Wilson, William L., Jr.
dc.creatorElias, Joseph A.
dc.date.accessioned 2009-06-04T00:05:55Z
dc.date.available 2009-06-04T00:05:55Z
dc.date.issued 1993
dc.identifier.citation Elias, Joseph A.. "A study of the photodissociation dynamics of dimethylzinc and the implications for the growth of zinc selenide films." (1993) Master’s Thesis, Rice University. https://hdl.handle.net/1911/13719.
dc.identifier.urihttps://hdl.handle.net/1911/13719
dc.description.abstract The dynamics of the ArF photodissociation of DMZn (dimethylzinc) have been studied. The implications of the results for the growth of ZnSe thin films are discussed. Time-resolved absorption profiles of ground state Zn and methyl radicals have been acquired using a plasma emission source. Time-resolved fluorescence from excited CH radicals has also been studied. The results indicate that the Zn concentration remains constant after the dissociating ArF pulse, indicating the system is a good source for free Zn atoms. The CH$\sb3$ radicals that are created recombine to form ethane, and simulations of the kinetics indicate that the concentration of methyl radicals reaching the substrate is insignificant. There was no indication of monomethylzinc formation. The CH radical is likely to combine with H$\sb2$ to form CH$\sb3$ within several microseconds. Thus the major sources for carbon contamination in the growth process (CH$\sb3$, MMZn, CH) are unlikely to reach the substrate.
dc.format.extent 117 p.
dc.format.mimetype application/pdf
dc.language.iso eng
dc.subjectElectronics
Electrical engineering
dc.title A study of the photodissociation dynamics of dimethylzinc and the implications for the growth of zinc selenide films
dc.type Thesis
dc.type.material Text
thesis.degree.department Electrical Engineering
thesis.degree.discipline Engineering
thesis.degree.grantor Rice University
thesis.degree.level Masters
thesis.degree.name Master of Science
dc.identifier.callno Thesis E.E. 1993 Elias


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