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Influence of Effective Modulus on Period-Doubling Bifurcation in Atomic Force Microscopy: Investigation and Implementation for Sample Characterization
(2011)
Atomic force microscope (AFM) is an important tool for measuring the topographical and other properties of a sample with nanometer resolution. The cantilever probe of the AFM is influenced by nonlinear interaction forces ...
Nonlinear Dynamics in Atomic Force Microscopy for Various Excitation Conditions
(2015-05-11)
The atomic force microscopy (AFM) is a high-resolution measurement tool for measuring sample topography and material properties in micro-scale and nano-scale research. The dynamics of the cantilever probe in AFM is influenced ...