Now showing items 1-3 of 3
Influence of Effective Modulus on Period-Doubling Bifurcation in Atomic Force Microscopy: Investigation and Implementation for Sample Characterization
Atomic force microscope (AFM) is an important tool for measuring the topographical and other properties of a sample with nanometer resolution. The cantilever probe of the AFM is influenced by nonlinear interaction forces ...
Temporal effects of cell adhesion on the mechanical characteristics of the single chondrocyte
Cell adhesion to material surfaces is a fundamental phenomenon in tissue response to implanted devices, and an important consideration in tissue engineering. The first objective of this study was to measure the mechanical ...
Nonlinear Dynamics in Atomic Force Microscopy for Various Excitation Conditions
The atomic force microscopy (AFM) is a high-resolution measurement tool for measuring sample topography and material properties in micro-scale and nano-scale research. The dynamics of the cantilever probe in AFM is influenced ...