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    • A Multifractal Wavelet Model for Positive Processes 

      Crouse, Matthew; Riedi, Rudolf H.; Ribeiro, Vinay Joseph; Baraniuk, Richard G. (1998-10-01)
      In this paper, we develop a new multiscale modeling framework for characterizing positive-valued data with long-range-dependent correlations (1/f noise). Using the Haar wavelet transform and a special multiplicative structure ...