Rice Univesrity Logo
    • FAQ
    • Deposit your work
    • Login
    View Item 
    •   Rice Scholarship Home
    • Rice University Graduate Electronic Theses and Dissertations
    • Rice University Electronic Theses and Dissertations
    • View Item
    •   Rice Scholarship Home
    • Rice University Graduate Electronic Theses and Dissertations
    • Rice University Electronic Theses and Dissertations
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Logic design for reliability

    Thumbnail
    Name:
    304507664.pdf
    Size:
    926.5Kb
    Format:
    PDF
    View/Open
    Author
    Choudhury, Mihir
    Date
    2008
    Advisor
    Mohanram, Kartik
    Degree
    Master of Science
    Abstract
    Reliability of logic circuits is emerging as an important concern that may limit the benefits of continued scaling of process technology and the emergence of future technology alternatives. Scaling of CMOS devices below 100nm has revealed their vulnerability to process variations, thermodynamic variations, transient errors due to radiation, electromagnetic interference and extreme scaling effects. Variations cause the output of gates to deviate from the correct value potentially leading to logic errors. The search for new devices to replace CMOS in the future has led to advances in the synthesis and self-assembly of nanoelectronic devices like carbon nanotube transistors that indicate the ability to manufacture dense nanoelectronic fabrics. However, the tremendous device densities afforded by nanoelectronic technologies is expected to be accompanied by substantial increases in defect densities, transient error rates, and performance variability. Thus, high failure rates are inherent to computing devices of the future and have led to an increased interest in investigating the potential of logic design techniques to improve circuit reliability. This thesis contributes to two major aspects of logic design for circuit reliability: (1) Computing the reliability of logic circuits built with unreliable devices. (2) Detection of errors in logic circuits based on approximate logic functions.
    Keyword
    Mathematics; Electrical engineering; Computer science; Applied sciences; Pure sciences
    Citation
    Choudhury, Mihir. "Logic design for reliability." (2008) Master’s Thesis, Rice University. https://hdl.handle.net/1911/103528.
    Metadata
    Show full item record
    Collections
    • Rice University Electronic Theses and Dissertations [13405]

    Home | FAQ | Contact Us | Privacy Notice | Accessibility Statement
    Managed by the Digital Scholarship Services at Fondren Library, Rice University
    Physical Address: 6100 Main Street, Houston, Texas 77005
    Mailing Address: MS-44, P.O.BOX 1892, Houston, Texas 77251-1892
    Site Map

     

    Searching scope

    Browse

    Entire ArchiveCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsTypeThis CollectionBy Issue DateAuthorsTitlesSubjectsType

    My Account

    Login

    Statistics

    View Usage Statistics

    Home | FAQ | Contact Us | Privacy Notice | Accessibility Statement
    Managed by the Digital Scholarship Services at Fondren Library, Rice University
    Physical Address: 6100 Main Street, Houston, Texas 77005
    Mailing Address: MS-44, P.O.BOX 1892, Houston, Texas 77251-1892
    Site Map