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dc.contributor.authorZhang, Jiahao
Zhao, Hengcan
Lv, Meng
Hu, Sile
Isikawa, Yosikazu
Yang, Yi-feng
Si, Qimiao
Steglich, Frank
Sun, Peijie
dc.date.accessioned 2018-09-27T17:33:26Z
dc.date.available 2018-09-27T17:33:26Z
dc.date.issued 2018
dc.identifier.citation Zhang, Jiahao, Zhao, Hengcan, Lv, Meng, et al.. "Kondo destruction in a quantum paramagnet with magnetic frustration." Physical Review B, 97, no. 23 (2018) https://doi.org/10.1103/PhysRevB.97.235117.
dc.identifier.urihttps://hdl.handle.net/1911/102725
dc.description.abstract We report results of isothermal magnetotransport and susceptibility measurements at elevated magnetic fields B down to very low temperatures T on single crystals of the frustrated Kondo-lattice system CePdAl. They reveal a B∗(T) line within the paramagnetic part of the phase diagram. This line denotes a thermally broadened “small”–to-“large” Fermi-surface crossover which substantially narrows upon cooling. At B0∗=B∗(T=0)=(4.6±0.1)T, this B∗(T) line merges with two other crossover lines, viz. Tp(B) below and TFL(B) above B0∗. Tp characterizes a frustration-dominated spin-liquid state, while TFL is the Fermi-liquid temperature associated with the lattice Kondo effect. Non-Fermi-liquid phenomena which are commonly observed near a “Kondo-destruction” quantum-critical point cannot be resolved in CePdAl. Our observations reveal a rare case where Kondo coupling, frustration, and quantum criticality are closely intertwined.
dc.language.iso eng
dc.rights Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
dc.title Kondo destruction in a quantum paramagnet with magnetic frustration
dc.type Journal article
dc.citation.journalTitle Physical Review B
dc.citation.volumeNumber 97
dc.citation.issueNumber 23
dc.identifier.digital PhysRevB.97.235117
dc.contributor.publisher American Physical Society
dc.type.dcmi Text
dc.identifier.doihttps://doi.org/10.1103/PhysRevB.97.235117
dc.type.publication publisher version
dc.citation.articleNumber 235117


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